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US Patent Issued to Carl Zeiss Microscopy on April 7 for "FCS method" (German Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,071, issued on April 7, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "FCS method" was invented by Dieter Huhse (Jena, German... Read More


US Patent Issued to STARNA SCIENTIFIC on April 7 for "Fluorimeter cell and its calibration" (British Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,072, issued on April 7, was assigned to STARNA SCIENTIFIC LTD (Essex, Great Britain). "Fluorimeter cell and its calibration" was invented b... Read More


US Patent Issued to YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM on April 7 for "Nanoscale optical biosensor based on material-associated single walled carbon nanotubes" (Israeli Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,073, issued on April 7, was assigned to YISSUM RESEARCH DEVELOPMENT COMPANY OF THE HEBREW UNIVERSITY OF JERUSALEM LTD (Jerusalem). "Nanosca... Read More


US Patent Issued to CANON on April 7 for "Camera system" (Japanese Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,074, issued on April 7, was assigned to CANON K.K. (Tokyo). "Camera system" was invented by Aihiko Numata (Tokyo). According to the abstra... Read More


US Patent Issued to General Electric, Oliver Crispin Robotics on April 7 for "Inspection systems and methods employing different wavelength directional light for enhanced imaging" (Indian, British Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,076, issued on April 7, was assigned to General Electric Co. (Evendale, Ohio) and Oliver Crispin Robotics Ltd. (Altrincham, Great Britain). ... Read More


US Patent Issued to Apple on April 7 for "Passive camera lens smudge detection" (California Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,077, issued on April 7, was assigned to Apple Inc. (Cupertino, Calif.). "Passive camera lens smudge detection" was invented by Xiaochun Liu... Read More


US Patent Issued to SK SILTRON on April 7 for "Apparatus for analyzing metal contamination of a wafer and a method thereof" (South Korean Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,078, issued on April 7, was assigned to SK SILTRON Co. LTD. (Gumi-si, South Korea). "Apparatus for analyzing metal contamination of a wafer... Read More


US Patent Issued to TANK-EYE IE on April 7 for "Assembly for sensory and visual inspection of a closed storage tank" (Dutch Inventor)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,079, issued on April 7, was assigned to TANK-EYE IE B.V. (Hendrik-Ido-Ambacht, Netherlands). "Assembly for sensory and visual inspection of... Read More


US Patent Issued to GM GLOBAL TECHNOLOGY OPERATIONS on April 7 for "Vision inspection systems and methods using light sources of different wavelengths" (Michigan Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,080, issued on April 7, was assigned to GM GLOBAL TECHNOLOGY OPERATIONS LLC (Detroit). "Vision inspection systems and methods using light s... Read More


US Patent Issued to ARIZONA BOARD OF REGENTS ON BEHALFOF ARIZONA STATE UNIVERSITY, California Institute of Technology on April 7 for "Compact, low-power, high image rejection sideband separation receiver" (Arizona, California Inventors)

ALEXANDRIA, Va., April 7 -- United States Patent no. 12,596,081, issued on April 7, was assigned to ARIZONA BOARD OF REGENTS ON BEHALFOF ARIZONA STATE UNIVERSITY (Scottsdale, Ariz.) and California Ins... Read More